TL1

24 TTL Channels, Programmable I/O

The TL1 family provides 24 individually programmable digital I/O channels that may be configured as either inputs or outputs and supports standard TTL/CMOS single-ended digital interface levels (System GND referenced, non-isolated). The module is optimized for 3.3 V logic operation and supports output drive from either an internally generated VCC source or an externally applied VCC supply (up to 5.5 V maximum) to support interfacing with both 3.3 V and 5 V logic environments.

Input functionality includes per-channel status monitoring and programmable interrupt generation on rising- or falling-edge transitions, with programmable debounce filtering and selectable delay to suppress false transitions caused by relay and switch contact bounce. All input channels are continuously scanned during operation. Output channels provide buffered TTL/CMOS drive capability with programmable logic state control and integrated readback verification. Continuous Background Built-In-Test (BIT) executes transparently during normal operation and provides real-time channel health monitoring by validating input channel integrity and comparing actual output states against commanded logic states to support reliable operation in mission-critical embedded systems.

Features

• 24 channels available as inputs or outputs
• Programmable debounce circuitry with selectable time delay eliminates false signals resulting from relay contact bounce
• Built-In-Test runs in background constantly monitoring system health for each channel